Upright Metallurgical Microscope – MX-1000M


  • With excellent NIS optical system, MX-1000 series microscope provides high resolution and chromatic aberration corrected images both in the eyepieces and on the monitor.
  • MX-1000 series has been designed with modularity to meet vairous industrial and materials science applications.
  • It gives users flexibility to build a system for specific needs.

Remote Control Pad

Remote Control Pad Objectives could be switched by Simply pressing the rotating buttons. Users could also self-define two of the most commonly used objectives User could swap between these two objectives by pressing the green button.

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Ergo Tilting Trinocular Head Eye tube can be adjustable from 00 to 35°, Trinocular tube can be connected to SLR camera and digital camera having a 3-postion beam splitter (0.100, 100 : 0 , 80:20 ) the splitter bar can be assembled on the either side according to user’s
requirement.

Darkfield Wafer

Darkfield enables the observation of scattered or diffracted light from the specimen. Anything that is not flat reflects this light while anything that is flat appears dark so imperfections clearly stand out. The user can identify the existence of even a minute scratch or flaw down to the 8nm level smaller than the resolving power limit of an optical microscope. Darkfield is ideal for detecting minute scratches or flaws on a specimen and examining mirror surface specimens, including wafers.

Polarized Light Asbestos

This microscopic observation technique utilizes polarized light generated by a set of filters (analyze/ and polarizer). The characteristics of the sample directly affect the intensity Of the light reflected through the system. It is suitable for metallurgical Structures (i.e., growth pattern of graphite on hodular casting iron), minerals, LCDs and, Semiconductor materials.

GTIN

Model

MX-1000M, MX-1050M

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